Image rotation of two-axis line-of-sight stabilization systemFENG YINGFENG; ZHU YUN.Proceedings of SPIE, the International Society for Optical Engineering. 2005, pp 60242F.1-60242F.6, issn 0277-786X, isbn 0-8194-6055-9, 1VolConference Paper

Optical micro- and nanometrology in manufacturing technology (Strasbourg, 29-30 April 2004)Gorecki, Christophe; Asundi, Anand K.SPIE proceedings series. 2004, isbn 0-8194-5380-3, VII, 300 p, isbn 0-8194-5380-3Conference Proceedings

Optical characterization of micro-electro-mechanical structuresANNOVAZZI-LODI, Valerio; BENEDETTI, Mauro; MERLO, Sabina et al.SPIE proceedings series. 2004, pp 196-207, isbn 0-8194-5380-3, 12 p.Conference Paper

A plastic fiber polarimetric sensor for dynamic applicationsHEGDE, Gopalkrishna; PURNOMO, E; ANG, E et al.SPIE proceedings series. 2004, pp 253-256, isbn 0-8194-5380-3, 4 p.Conference Paper

Photopolymerization induced materialization of the dipolar response from isolated metallic nanoparticlesWURTZ, Gregory; BURGET, Dominique; CARRE, Christiane et al.SPIE proceedings series. 2004, pp 278-286, isbn 0-8194-5380-3, 9 p.Conference Paper

Lateral error reduction in the 3D characterization of deep MOEMS devices using white light interference microscopyMONTGOMERY, Paul; MONTANER, Denis; MANZARDO, Omar et al.SPIE proceedings series. 2004, pp 34-42, isbn 0-8194-5380-3, 9 p.Conference Paper

Application on multi-channel V-groove inspectionLI, Chx; ASUNDI, A. K; FANG, Zh P et al.SPIE proceedings series. 2004, pp 71-78, isbn 0-8194-5380-3, 8 p.Conference Paper

Design, testing and calibration of an integrated Mach-Zehnder based optical read-out architecture for MEMS characterizationSABAC, A; GORECKI, C; JOZWIK, M et al.SPIE proceedings series. 2004, pp 141-146, isbn 0-8194-5380-3, 6 p.Conference Paper

Near-field scanning photoluminescence microscopy of InGaN/GaN quantum structuresTRIPATHY, S; CHUA, S. J.SPIE proceedings series. 2004, pp 155-162, isbn 0-8194-5380-3, 8 p.Conference Paper

Sensitivity-tunable interferometric system based on surface plasmon resonanceWU, Chien-Ming; PAO, Ming-Chi.SPIE proceedings series. 2004, pp 147-154, isbn 0-8194-5380-3, 8 p.Conference Paper

Singular Stokes-polarimetry as new technique for metrology and inspection of polarized speckle fieldsSOSKIN, Marat S; DENISENKO, Vladimir G; EGOROV, Roman I et al.SPIE proceedings series. 2004, pp 79-85, isbn 0-8194-5380-3, 7 p.Conference Paper

Near-field optical measurements using rare-earth-doped glass-ceramic particlesAIGOUY, Le; MORTIER, M; DE WILDE, Y et al.SPIE proceedings series. 2004, pp 163-170, isbn 0-8194-5380-3, 8 p.Conference Paper

An optical 'workstation' for characterization and modification of MEMSMEDLEY, John; BURDESS, Jim S; HARRIS, Alun J et al.SPIE proceedings series. 2004, pp 244-252, isbn 0-8194-5380-3, 9 p.Conference Paper

Femtosecond ablation scaling for different materialsGONZALES, P; BERNATH, R; DUNCAN, J et al.SPIE proceedings series. 2004, pp 265-272, isbn 0-8194-5380-3, 8 p.Conference Paper

Scanning Diffraction Microscopy: far field microscopy by interferometry and diffraction combinationSELCI, S.SPIE proceedings series. 2004, pp 109-116, isbn 0-8194-5380-3, 8 p.Conference Paper

Tomographic microinterferometry of refractive index distributionKNIAZEWSKI, Pawel; KUJAWINSKA, Malgorzata; OTTEVAERE, Heidi et al.SPIE proceedings series. 2004, pp 52-63, isbn 0-8194-5380-3, 12 p.Conference Paper

A miniaturized SNOM sensor based on the optical feedback inside the VCSEL cavityGORECKI, Christophe; HEINIS, Dominique.SPIE proceedings series. 2004, pp 183-187, isbn 0-8194-5380-3, 5 p.Conference Paper

Metrology of refractive microlens arraysWEIBLE, Kenneth J; VÖLKEL, Reinhard; EISNER, Martin et al.SPIE proceedings series. 2004, pp 43-51, isbn 0-8194-5380-3, 9 p.Conference Paper

Modified linear and circular carrier frequency Fourier transform method applied for studies of vibrating microelementsKACPERSKI, Jacek; KUJAWINSKA, Malgorzata; KREZEL, Jerzy et al.SPIE proceedings series. 2004, pp 287-298, isbn 0-8194-5380-3, 12 p.Conference Paper

Performance of a multi-fiber polarimetric strain sensorHEGDE, Gopalkrishna; SUKIA, Eluska; LIM CHOO MIN et al.SPIE proceedings series. 2004, pp 129-135, isbn 0-8194-5380-3, 7 p.Conference Paper

Real-time shape measurement system including CG-outputMORIMOTO, Yoshiharu; FUJIGAKI, Motoharu; SAUGIER, Rodolphe et al.SPIE proceedings series. 2004, pp 117-128, isbn 0-8194-5380-3, 12 p.Conference Paper

Three-dimensional dynamic environmental MEMS characterizationNOVAK, Erik.SPIE proceedings series. 2004, pp 1-8, isbn 0-8194-5380-3, 8 p.Conference Paper

Research of on-axis tracking technology based on equal acceleration modelLI WENIUN; ZHAO JINYU; CHEN TAO et al.Proceedings of SPIE, the International Society for Optical Engineering. 2005, pp 60242C.1-60242C.6, issn 0277-786X, isbn 0-8194-6055-9, 1VolConference Paper

Hybrid analysis of micromachined silicon thin film based on digital microscopic holographyLEI XU; XIAOYUAN PENG; JIANMIN MIAO et al.SPIE proceedings series. 2004, pp 236-243, isbn 0-8194-5380-3, 8 p.Conference Paper

Application of the vortex transform to microscopic interferometryPETITGRAND, Sylvain; BOSSEBOEUF, Alain; GUIRARDEL, Matthieu et al.SPIE proceedings series. 2004, pp 9-15, isbn 0-8194-5380-3, 7 p.Conference Paper